The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Feb. 23, 2010
Shiro Fujieda, Kyoto, JP;
Atsushi Taneno, Kyoto, JP;
Hiroshi Yano, Toyonaka, JP;
Yasuyuki Ikeda, Ikeda, JP;
Shiro Fujieda, Kyoto, JP;
Atsushi Taneno, Kyoto, JP;
Hiroshi Yano, Toyonaka, JP;
Yasuyuki Ikeda, Ikeda, JP;
Omron Corporation, Kyoto-shi, JP;
Abstract
In the present invention, whether three-dimensional measurement or checking processing with a model is properly performed by setting information and recognition processing result can easily be confirmed. After setting processing is performed to a three-dimensional visual sensor including a stereo camera, a real workpiece is imaged, the three-dimensional measurement is performed to an edge included in a produced stereo image, and restored three-dimensional information is checked with a three-dimensional model to compute a position of the workpiece and a rotation angle for an attitude indicated by the three-dimensional model. Thereafter, perspective transformation of the three-dimensional information on the edge obtained through measurement processing and the three-dimensional model to which coordinate transformation is already performed based on recognition result is performed into a coordinate system of a camera that performs the imaging, and projection images are displayed while being able to be checked with each other.