The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2012
Filed:
Feb. 23, 2010
Shiro Fujieda, Kyoto, JP;
Atsushi Taneno, Kyoto, JP;
Hiroshi Yano, Toyonaka, JP;
Yasuyuki Ikeda, Ikeda, JP;
Shiro Fujieda, Kyoto, JP;
Atsushi Taneno, Kyoto, JP;
Hiroshi Yano, Toyonaka, JP;
Yasuyuki Ikeda, Ikeda, JP;
Omron Corporation, Kyoto, JP;
Abstract
In the present invention, processing for setting a parameter expressing a measurement condition of three-dimensional measurement to a value necessary to output a proper recognition result is easily performed. The three-dimensional measurement is performed to stereo images of real models WMand WMof a workpiece using a measurement parameter set by a user, and positions and attitudes of the workpiece models WMand WMare recognized based on the measurement result. An image expressing the recognition result is displayed, and numerical data indicating the selected recognition result is set to sample data in response to a user manipulation for selecting the recognition result. A setting value of the measurement parameter is changed every time in a predetermined numerical range, the three-dimensional measurement and recognition processing are performed using the setting measurement parameter, and a numerical range of the setting parameter is set to an acceptable range when the recognition result in which an amount of difference with sample data falls within a predetermined value is obtained. An intermediate value of the acceptable range is fixed and registered as an optimum value of the parameter.