The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 11, 2014

Filed:

Aug. 28, 2008
Applicants:

Yasuyuki Ikeda, Ikeda, JP;

Shiro Fujieda, Kyoto, JP;

Hiroshi Yano, Toyonaka, JP;

Inventors:

Yasuyuki Ikeda, Ikeda, JP;

Shiro Fujieda, Kyoto, JP;

Hiroshi Yano, Toyonaka, JP;

Assignee:

Omron Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/00 (2006.01); G01C 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A control processing unit simultaneously drives cameras to produce images of a measuring object, the control processing unit searches corresponding point on a comparative image produced by one of the cameras for a representative point in a reference image produced by the other camera, and the control processing unit computes a three-dimensional coordinate corresponding to a coordinate using the coordinate of each point correlated by the search. The control processing unit also obtains a shift amount at the corresponding point specified by the search to an epipolar line specified based on a coordinate of a representative point on the reference image side or a parameter indicating a relationship between the cameras, and the control processing unit supplies the shift amount as an evaluation value indicating accuracy of three-dimensional measurement along with three-dimensional measurement result.


Find Patent Forward Citations

Loading…