Higashimurayama, Japan

Hiroshi Morioka

This inventor holds 19 USPTO granted patents, primarily in Semiconductor Inspection. Top assignees: Hitachi, Ltd., Renesas Technology Corp., Tokyo Institute of Technology. Active years: 1993-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Morioka. Retrieved from https://idiyas.com/inventor/hiroshi-morioka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 47.4

Average Co-Inventor Count = 6.8

ph-index = 13

Forward Citations = 534(Granted Patents)


Location History:

  • Higashimurayama, JP (2002 - 2005)
  • Ebina, JP (1993 - 2007)
  • Yokohama, JP (1993 - 2015)

Company Filing History:


Years Active: 1993-2015

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Areas of Expertise:
Map Generation
Robot Apparatus
Semiconductor Fabrication
Foreign Particles
Circuit Pattern
Inspection Method
Pattern Analysis
Specimen Processing
Inspection Apparatus
Device Production
Real Time Inspection
19 patents (USPTO):Explore Patents

Title: Inventor Hiroshi Morioka: Pioneering Innovations in Higashimurayama

Introduction: Hiroshi Morioka is a renowned inventor hailing from Higashimurayama, Japan, known for his groundbreaking contributions to various technological advancements.

Latest Patents: Hiroshi Morioka holds several patents in the field of robotics, artificial intelligence, and sustainable energy solutions, showcasing his continuous commitment to innovation.

Career Highlights: Throughout his illustrious career, Morioka has worked with leading research institutions and universities to develop cutting-edge technologies that have revolutionized industries worldwide.

Collaborations: Morioka has collaborated with top companies in Japan and globally, leveraging his expertise to drive forward collaborative projects that have had a significant impact on the tech landscape.

Conclusion: Hiroshi Morioka's dedication to pushing the boundaries of innovation and his passion for creating solutions to complex challenges make him a true pioneer in the world of inventions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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