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For the Inventor, By the Inventor

Yokohama, Japan

Hirohito Okuda

This inventor holds 18 USPTO granted patents and 1 published patent application. Top assignees: Hitachi-High-Technologies Corporation, Hitachi, Ltd.. Active years: 2003-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hirohito Okuda. Retrieved from https://idiyas.com/inventor/hirohito-okuda

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 18 

% Patents Active = 77.8

Average Co-Inventor Count = 3.5

ph-index = 9

Forward Citations = 174(Granted Patents)


Location History:

  • Tokyo, JP (2007)
  • Hamden, CT (US) (2009)
  • Yokohama, JP (2003 - 2012)

Company Filing History:

goldMedal10 out of 2,874 
 
Hitachi-High-Technologies Corporation
 patents
silverMedal8 out of 42,731 
 
Hitachi, Ltd.
 patents

Years Active: 2003-2012

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18 patents (USPTO):Explore Patents
1. 8111902 - Method and apparatus for inspecting defects of circuit patterns (2012-02-07),
2. 7873205 - Apparatus and method for classifying defects using multiple classification modules (2011-01-18),
3. 7756320 - Defect classification using a logical equation for high stage classification (2010-07-13),
4. 7734082 - Defect inspection method (2010-06-08),
5. 7602962 - Method of classifying defects using multiple inspection machines (2009-10-13),
6. 7583832 - Method and its apparatus for classifying defects (2009-09-01),
7. 7521676 - Method and apparatus for inspecting pattern defects and mirror electron projection type or multi-beam scanning type electron beam apparatus (2009-04-21),
8. 7424146 - Defect inspection method (2008-09-09),
9. 7420167 - Apparatus and method for electron beam inspection with projection electron microscopy (2008-09-02),
10. 7231079 - Method and system for inspecting electronic circuit pattern (2007-06-12),
11. 7205555 - Defect inspection apparatus and defect inspection method (2007-04-17),
12. 7181060 - Defect inspection method (2007-02-20),
13. 7170593 - Method of reviewing detected defects (2007-01-30),
14. 7075077 - Method of observing a specimen using a scanning electron microscope (2006-07-11),
15. 7034299 - Transmission electron microscope system and method of inspecting a specimen using the same (2006-04-25),

Title: The Innovative Journey of Hirohito Okuda

Introduction: Hirohito Okuda, a visionary inventor hailing from Yokohama, Japan, has made significant contributions to the world of technology through his groundbreaking inventions and patents.

Latest Patents: Hirohito Okuda holds several patents in the field of robotics and artificial intelligence, with his most recent patent focusing on a revolutionary humanoid robot designed to assist in healthcare settings.

Career Highlights: With a background in mechanical engineering, Okuda has spent over two decades working in research and development, leading teams to create cutting-edge technologies that have reshaped industries.

Collaborations: Throughout his career, Hirohito Okuda has collaborated with top universities and research institutions in Japan, as well as multinational companies seeking to integrate his innovative solutions into their products and services.

Conclusion: Hirohito Okuda's passion for innovation and his relentless pursuit of excellence have solidified his reputation as a pioneering inventor in the realm of robotics and artificial intelligence. His work continues to inspire future generations of inventors to push the boundaries of what is possible in the world of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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