The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 18, 2011
Filed:
Mar. 26, 2004
Hirohito Okuda, Yokohama, JP;
Yuji Takagi, Kamakura, JP;
Toshifumi Honda, Yokohama, JP;
Atsushi Miyamoto, Yokohama, JP;
Takehiro Hirai, Ushiku, JP;
Hirohito Okuda, Yokohama, JP;
Yuji Takagi, Kamakura, JP;
Toshifumi Honda, Yokohama, JP;
Atsushi Miyamoto, Yokohama, JP;
Takehiro Hirai, Ushiku, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
A classification model optimum for realization of a defect classification request by a user is not known by the user. Then, the user sets a classification model which is not necessarily suitable and makes classification, resulting in degradation in classification performance. Therefore, the present invention automatically generates plural potential classification models and combines class likelihoods calculated from the plural classification models to classify. To combine, an index about the adequacy of each model, in other words, an index indicating a reliable level of likelihood calculated from the each potential classification model, is also calculated. Considering the calculated result, the class likelihoods calculated from the plural classification models are combined to execute classification.