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Hidehiro Kiyofuji

USPTO Granted Patents = 12

Average Co-Inventor Count = 3.5

ph-index = 4

Forward Citations = 37(Granted Patents)

Location History:

Aomori, JP (2008 - 2009)
Hirosaki, JP (2009)
Oita, JP (2010 - 2014)
Saitama, JP (2010 - 2017)
Tokyo, JP (2016 - 2020)

Company Filing History:

Kabushiki Kaisha Nihon Micronics

Years Active: 2008-2020

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12 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 10705122 - Probe card (2020-07-07),

2. 10295590 - Probe card with temperature control function, inspection apparatus using the same, and inspection method (2019-05-21),

3. 9535090 - Electric connecting apparatus (2017-01-03),

4. 9400309 - Electric connecting apparatus (2016-07-26),

5. 9341651 - Probe card and method for manufacturing the same (2016-05-17),

6. 8680880 - Method and apparatus for testing integrated circuit (2014-03-25),

7. 7843204 - Electrical connecting apparatus (2010-11-30),

8. 7667472 - Probe assembly, method of producing it and electrical connecting apparatus (2010-02-23),

9. 7586316 - Probe board mounting apparatus (2009-09-08),

10. 7525329 - Electrical connecting apparatus (2009-04-28),

11. 7468610 - Electrical connecting apparatus (2008-12-23),

12. 7458818 - Electric connector and electrical connecting apparatus using the same (2008-12-02),

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