logo

For the Inventor, By the Inventor

Saitama, Japan

Hidehiro Kiyofuji

USPTO Granted Patents = 12

Average Co-Inventor Count = 3.5

ph-index = 4

Forward Citations = 37(Granted Patents)


Location History:

  • Aomori, JP (2008 - 2009)
  • Hirosaki, JP (2009)
  • Oita, JP (2010 - 2014)
  • Saitama, JP (2010 - 2017)
  • Tokyo, JP (2016 - 2020)

Company Filing History:

goldMedal12 out of 226 
 
Kabushiki Kaisha Nihon Micronics
 patents

Years Active: 2008-2020

Loading Chart...
12 patents (USPTO):Explore Patents
1. 10705122 - Probe card (2020-07-07),
2. 10295590 - Probe card with temperature control function, inspection apparatus using the same, and inspection method (2019-05-21),
3. 9535090 - Electric connecting apparatus (2017-01-03),
4. 9400309 - Electric connecting apparatus (2016-07-26),
5. 9341651 - Probe card and method for manufacturing the same (2016-05-17),
6. 8680880 - Method and apparatus for testing integrated circuit (2014-03-25),
7. 7843204 - Electrical connecting apparatus (2010-11-30),
8. 7667472 - Probe assembly, method of producing it and electrical connecting apparatus (2010-02-23),
9. 7586316 - Probe board mounting apparatus (2009-09-08),
10. 7525329 - Electrical connecting apparatus (2009-04-28),
11. 7468610 - Electrical connecting apparatus (2008-12-23),
12. 7458818 - Electric connector and electrical connecting apparatus using the same (2008-12-02),

Title: Innovations by Hidehiro Kiyofuji

Introduction

Hidehiro Kiyofuji is a prominent inventor based in Saitama, Japan. He has made significant contributions to the field of probe card technology, holding a total of 12 patents. His work focuses on enhancing the efficiency and accuracy of inspection processes in various applications.

Latest Patents

One of Kiyofuji's latest patents is a probe card designed to simplify the adjustment of height deviations of needle tip parts and the parallelism between the probes and the object being inspected. This innovative probe card features a wiring substrate with integrated wiring, multiple probes, and a dielectric film. The dielectric film is strategically positioned to ensure that it faces the needle tip parts and the main surface of the wiring substrate, facilitating effective capacitive coupling during inspections.

Another notable patent involves a probe card with a temperature control function. This invention ensures uniform temperature distribution, allowing for precise inspections. The probe card includes a supporting substrate, a wiring layer, and multiple heaters arranged in designated regions. This design enables the inspection apparatus to maintain optimal conditions for accurate results.

Career Highlights

Kiyofuji is currently employed at Kabushiki Kaisha Nihon Micronics, where he continues to develop cutting-edge technologies in the field of inspection apparatus. His expertise and innovative mindset have positioned him as a key player in advancing probe card technology.

Collaborations

Throughout his career, Kiyofuji has collaborated with talented individuals such as Yuji Miyagi and Kiyotoshi Miura. These partnerships have fostered a creative environment that encourages the development of groundbreaking inventions.

Conclusion

Hidehiro Kiyofuji's contributions to probe card technology exemplify his dedication to innovation and excellence. His patents reflect a commitment to improving inspection processes, making him a notable figure in the field.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…