The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2014
Filed:
Dec. 14, 2009
Hidehiro Kiyofuji, Oita, JP;
Tetsuya Iwabuchi, Aomori, JP;
Toshiyuki Kudo, Aomori, JP;
Seiji Kanazawa, Aomori, JP;
Hidehiro Kiyofuji, Oita, JP;
Tetsuya Iwabuchi, Aomori, JP;
Toshiyuki Kudo, Aomori, JP;
Seiji Kanazawa, Aomori, JP;
Kabushiki Kaisha Nihon Micronics, Tokyo, JP;
Abstract
An embodiment of a method for testing an integrated circuit comprises a first step for determining at least one of a group selected from whether or not the chuck top receiving the integrated circuit exists near a probe card which transmits and receives electrical signals to and from the integrated circuit, whether or not the integrated circuit is under testing, and whether or not the probe card has a given temperature, and a second step for adjusting power for heating to be supplied to a heating element provided in the probe card according to the determination result in the first step.