The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 23, 2010
Filed:
May. 23, 2005
Kiyotoshi Miura, Aomori, JP;
Hidehiro Kiyofuji, Saitama, JP;
Yuji Miyagi, Aomori, JP;
Shinji Kuniyoshi, Tokyo, JP;
Hitoshi Sato, Aomori, JP;
Kiyotoshi Miura, Aomori, JP;
Hidehiro Kiyofuji, Saitama, JP;
Yuji Miyagi, Aomori, JP;
Shinji Kuniyoshi, Tokyo, JP;
Hitoshi Sato, Aomori, JP;
Kabushiki Kaisha Nihon Micronics, Musashino-shi, Tokyo, JP;
Abstract
A probe assembly for use in electrical measurement of a device under test. The probe assembly comprises a plate-like probe base plate with bending deformation produced in a free state without load, and a plurality of probes formed on one face of the probe base plate to project from the face. All the tips of the probes are positioned on the same plane parallel to an imaginary reference plane of the probe base plate.