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Yokohama, Japan

Hideaki Hashimoto

USPTO Granted Patents = 17

Average Co-Inventor Count = 2.6

ph-index = 4

Forward Citations = 149(Granted Patents)

Location History:

Kanagawa-Ken, JP (2008 - 2010)
Kanagawa, JP (1988 - 2017)
Yokohama, JP (1994 - 2021)

Company Filing History:

Nuflare Technology, Inc.

7 out of 52,711

Kabushiki Kaisha Toshiba

where one patent can have more than one assignee

Years Active: 1988-2021

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17 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11189459 - Multibeam inspection apparatus (2021-11-30),

2. 11004193 - Inspection method and inspection apparatus (2021-05-11),

3. 10997713 - Inspection device, inspection method, and storage medium (2021-05-04),

4. 10984525 - Pattern inspection method and pattern inspection apparatus (2021-04-20),

5. 10846846 - Pattern inspection apparatus and pattern inspection method (2020-11-24),

6. 10775326 - Electron beam inspection apparatus and electron beam inspection method (2020-09-15),

7. 10712295 - Electron beam inspection apparatus and electron beam inspection method (2020-07-14),

8. 9646374 - Line width error obtaining method, line width error obtaining apparatus, and inspection system (2017-05-09),

9. 9575010 - Inspection apparatus and inspection method (2017-02-21),

10. 9196033 - Inspection sensitivity evaluation method (2015-11-24),

11. 9021406 - Pattern inspection method of semiconductor device optical image (2015-04-28),

12. 7765023 - Robot controller and robot controlling method (2010-07-27),

13. 7570005 - Wheeled moving robot (2009-08-04),

14. 7522636 - System for controlling a plurality of equipments (2009-04-21),

15. 7397214 - Wheeled moving robot (2008-07-08),

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