The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 04, 2021
Filed:
Feb. 28, 2019
Kabushiki Kaisha Toshiba, Minato-ku, JP;
Nuflare Technology, Inc., Yokohama, JP;
Takeshi Morino, Yokohama, JP;
Hideaki Okano, Yokohama, JP;
Yoshinori Honguh, Yokohama, JP;
Ryoichi Hirano, Tokyo, JP;
Masataka Shiratsuchi, Kawasaki, JP;
Hideaki Hashimoto, Yokohama, JP;
KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;
NuFlare Technology, Inc., Yokohama, JP;
Abstract
According to one embodiment, an inspection device includes: an image generation device configured to generate a second image corresponding to a first image; and a defect detection device configured to estimate a nonlinear shift based on a plurality of partial region sets, each of the partial region sets including a first partial region in the first image and a second partial region in the second image corresponding to the first partial region, and detect a defect in the second image from the first image.