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Oberägeri, Switzerland

Helmut Fischer

USPTO Granted Patents = 21 (Patent Applications = 1)

EPO Patents = 11 (Patent Applications = 10)

Average Co-Inventor Count = 1.0

ph-index = 4

Forward Citations = 32(Granted Patents)

Location History:

Sindelfingen, DE (2004 - 2009)
Oberägeri, DE (2009)
Oberageri, CH (2017)
Oberaegeri, CH (2013 - 2020)
Oberägeri, CH (2008 - 2024)

Company Filing History:

Immobiliengesellschaft Helmut Fischer Gmbh Co. Kg

Helmut Fischer Gmbh Institut Fur Elektronik Und Messtechnik

Helmut Fischer Gmbh Institut Fuer Elektronik Und Messtechnik

Helmut Fischer Gmbh & Co.

Helmut Fischer Gbmh Institut Für Elektronik Und Messtechnik

where one patent can have more than one assignee

Years Active: 2004-2024

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21 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 11867666 - Measuring system, measuring arrangement and method for determining measuring signals during a penetration movement of a penetration body into a surface of a test body (2024-01-09),

2. 11385151 - Measuring device and detection of measurement signals during a penetrating movement of penetrating member (2022-07-12),

3. 10837888 - Measuring system, measuring arrangement, and method for determining measuring signals during a penetration movement of a penetration body into a surface of a test body (2020-11-17),

4. 10584952 - Measuring probe for non-destructive measuring of the thickness of thin layers (2020-03-10),

5. 9857171 - Measuring probe for non-destructive measuring of the thickness of thin layers (2018-01-02),

6. 9835439 - Method for electronic control of a measurement stand (2017-12-05),

7. 9772205 - Method for electronically activating a measurement stand, and measurement stand for supporting a measuring probe (2017-09-26),

8. 9605940 - Measuring probe for measuring the thickness of thin layers, and method for the production of a sensor element for the measuring probe (2017-03-28),

9. 9435629 - Measuring probe with shielding element for measuring the thickness of thin layers (2016-09-06),

10. 9074880 - Measuring probe for non-destructive measuring of the thickness of thin layers (2015-07-07),

11. 8745889 - Measurement stand and method of its electrical control (2014-06-10),

12. 8560269 - Method for outputting measured values and display device (2013-10-15),

13. 8474151 - Method and device for measuring the thickness of thin layers over large-area surfaces to be measured (2013-07-02),

14. 7690243 - Method and apparatus for measurement of the thickness of thin layers by means of measurement probe (2010-04-06),

15. 7610690 - Measurement stand for holding a measuring instrument (2009-11-03),

Title: Helmut Fischer - Innovator from Oberägeri, CH

Introduction: Helmut Fischer is a renowned inventor hailing from Oberägeri, Switzerland, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Helmut Fischer holds several patents in the areas of precision measurement instruments and industrial coatings. His most recent patents focus on advanced materials testing methods and quality control systems for manufacturing processes.

Career Highlights: Throughout his illustrious career, Helmut Fischer has been instrumental in developing cutting-edge technologies that have revolutionized industries such as automotive, aerospace, and electronics. His innovative solutions have set new standards for precision and reliability in manufacturing.

Collaborations: Helmut Fischer has collaborated with leading research institutions and multinational corporations to further enhance his inventions and bring them to the global market. His partnerships have resulted in the successful implementation of his technologies in diverse applications worldwide.

Conclusion: Helmut Fischer's dedication to innovation and his relentless pursuit of excellence have established him as a visionary inventor in the field of technology. His impact on the industry continues to inspire future generations of inventors and innovators worldwide.

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