The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 06, 2016
Filed:
May. 24, 2012
Helmut Fischer, Oberägeri, CH;
Helmut Fischer, Oberägeri, CH;
Helmut Fischer GmbH Institut für Elektronik und Messtechnik, Sindelfingen, DE;
Abstract
The invention relates to a measuring probe for measuring the thickness of thin layers, having a housing () with at least one sensor element (), which is received at least slightly moveably along a longitudinal axis () and which comprises at least one first winding device (), which has a magnetic pot core () arranged in the longitudinal axis () of the housing (), and to whose central pin () a first and second coil () are allocated, and having a spherical positioning cap () on the central pin () pointing towards the measuring surface of an object to be measured, which cap comprises a bearing surface () for fitting on a measuring surface, wherein a second winding device () is provided allocated to the spherical positioning cap (), which device is formed from a discoidal or annular carrier () having at least one Archimedean coil (), and a shield () is provided at least partially between the first and second winding device ().