The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
Feb. 09, 2015
Helmut Fischer Gmbh Institut Fur Elektronik Und Messtechnik, Sindelfingen, DE;
Helmut Fischer, Oberageri, CH;
Helmut Fischer GmbH Institut für Elektronik und Messtechnik, Sindelfingen, DE;
Abstract
A method for electrically activating a measurement stand with a movement of at least one measuring probe () from a starting position () into a measuring position () and also a measurement stand for supporting a measuring probe, in particular for measuring the thickness of thin layers, in which a motor () is activated by a control arrangement (), which moves a ram () up and down via a drive arrangement (), wherein a retainer () is provided on the ram (), to which retainer the measuring probe () can be fastened, in which a freewheel is activated between the drive arrangement () and the ram () as soon as the measuring probe () or retainer () is set down in the measuring position () on an item to be measured () and the movement of the drive arrangement () is decoupled from the vertical movement of the ram (), wherein a movement speed of the at least one measuring probe () from the starting position () into the measuring position () is reduced by mechanical damping or electrical damping before the measuring position () is reached.