Immobiliengesellschaft Helmut Fischer Gmbh Co. Kg

Helmut Fischer Gmbh Institut Fur Elektronik Und Messtechnik

Helmut Fischer Gmbh Institut Fuer Elektronik Und Messtechnik

Helmut Fischer Gmbh & Co.

Helmut Fischer Gbmh Institut Für Elektronik Und Messtechnik

Helmut Fischer

Bernhard Scherzinger

Volker Rössiger

A measuring device for detecting measuring signals during either a scanning across a surface to determine a surface profile or a penetration movement of an indenter into a surface of the specimen to determine hardness, and, scanning with sufficient force to determine the scratch resistance of the specimen is described. All of the measurements can be done on the same specimen without unmounting the specimen from a holder. A camera mounted to the same framework as the measuring device enables further documentation of the specimen being tested.

Measuring system, measuring arrangement and method for determining measuring signals during a penetration movement of a penetration body into a surface of a test body

A measuring device for detection pf measurement signals during a penetrating movement of a penetrating member into a surface of a test object or during a sensing movement of the penetrating member on the surface of the test object. The measuring device includes a housing which accommodates a force generating device and on which a holding element is arranged remote from the force generating device, which holding element is movable relative to the housing at least in one direction along a longitudinal axis of the housing and which accommodates the penetrating member. The measuring device also includes at least one first measuring element for measuring the penetration depth of the penetrating member into the surface of the test object or a traversing movement of the penetrating member along the longitudinal axis relative to the housing during a sensing movement on the surface of the test object, wherein a transmission element is provided which extends between the force generating device and the penetrating member.

Measuring device and detection of measurement signals during a penetrating movement of penetrating member

A measuring system for detecting measuring signals during a penetration movement of a penetration body into a surface of a test body, including a housing with a power generating device, which is operatively connected to a penetration body for generating a displacement movement of the penetration body along a longitudinal axis of the housing, and which actuates a penetration movement of the penetration body into the surface of the test body to be examined, or which positions the penetration body on the surface of the test body for scanning, and having at least one first measuring device for measuring the penetration depth into the surface of the test body or a displacement movement of the penetration body along the longitudinal axis of the housing during a scanning movement on the surface of the test body. The power generating device is actuated by a pressure medium for the penetration movement of the penetration body.

Measuring system, measuring arrangement, and method for determining measuring signals during a penetration movement of a penetration body into a surface of a test body

Measuring probe for non-destructive measuring of the thickness of thin layers, in particular in cavities, which are accessible by an opening or on curved surfaces, with a measuring head, which includes at least one sensor element and at least one contact spherical cap, assigned to the sensor element on a surface, to be checked, of the cavity, and with a gripping element for positioning and guiding the measuring probe on and/or along the surface to be measured, wherein on the gripping element, a long, elastically yielding guide bar is provided, which accepts the at least one measuring head on its end opposing the gripping element, in such a way that it is moveable with at least one degree of freedom in relation to the guide bar.

Measuring probe for non-destructive measuring of the thickness of thin layers

The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers on an object with a measuring head, which comprises at least one sensor element for contact on a measurement surface of an object, and with a support device for receiving the measuring head, which is at least partly surrounded by a housing, wherein at least one further measuring head, which is adjacent to and separated from the first measuring head, is arranged on the support device, which can be controlled independently of the first measuring head.

The invention relates to a method for the electric control of a measurement stand () having a drive movement of at least one measurement probe () from an initial position () into a measurement position (), in particular for the measurement of the thickness of thin layers in which a motor () is controlled for the drive movement of the measurement probe (), said motor () moving a ram (), to which the measurement probe () is fastened, back and forth via a drive device () at least for the implementation of a measurement, wherein before a first measurement with the measurement probe (), a learning routine is carried out, and for the subsequent implementation of one or more measurements, the measurement probe () is transferred from the initial position () into the measurement position (), and the drive path of the measurement probe () from the initial position () into the measurement position () is divided into a fast speed and, before the setting of the measurement probe () on the measurement object (), a slow speed, wherein the number of pulses for the fast speed is reduced by the number of pulses for the slow speed, originating from the total number of the determined pulses of the drive path and the number of pulses for the drive path at the fast speed is a multiple of the number of pulses of the drive path at the slow speed.

Method for electronic control of a measurement stand

A method for electrically activating a measurement stand with a movement of at least one measuring probe () from a starting position () into a measuring position () and also a measurement stand for supporting a measuring probe, in particular for measuring the thickness of thin layers, in which a motor () is activated by a control arrangement (), which moves a ram () up and down via a drive arrangement (), wherein a retainer () is provided on the ram (), to which retainer the measuring probe () can be fastened, in which a freewheel is activated between the drive arrangement () and the ram () as soon as the measuring probe () or retainer () is set down in the measuring position () on an item to be measured () and the movement of the drive arrangement () is decoupled from the vertical movement of the ram (), wherein a movement speed of the at least one measuring probe () from the starting position () into the measuring position () is reduced by mechanical damping or electrical damping before the measuring position () is reached.

Method for electronically activating a measurement stand, and measurement stand for supporting a measuring probe

The invention relates to a measuring probe for measuring the thickness of thin layers with a housing, having at least one sensor element, which is received in the housing at least slightly moveably along a longitudinal axis and which comprises at least one winding device, which is allocated to the longitudinal axis, having a spherical positioning cap facing the outer front face of the housing, said cap being arranged in the longitudinal axis, wherein the spherical positioning cap has a basic body that has a cylindrical core section and a pole cap arranged on a front face of the core section, wherein the winding device is allocated to the spherical positioning cap, said winding device being formed from a discoidal or annular carrier with at least one Archimedean coil arranged thereon and with the basic body consisting of a ferritic material and the pole cap consisting of a hard metal.

Measuring probe for measuring the thickness of thin layers, and method for the production of a sensor element for the measuring probe

The invention relates to a measuring probe for measuring the thickness of thin layers, having a housing () with at least one sensor element (), which is received at least slightly moveably along a longitudinal axis () and which comprises at least one first winding device (), which has a magnetic pot core () arranged in the longitudinal axis () of the housing (), and to whose central pin () a first and second coil () are allocated, and having a spherical positioning cap () on the central pin () pointing towards the measuring surface of an object to be measured, which cap comprises a bearing surface () for fitting on a measuring surface, wherein a second winding device () is provided allocated to the spherical positioning cap (), which device is formed from a discoidal or annular carrier () having at least one Archimedean coil (), and a shield () is provided at least partially between the first and second winding device ().

Measuring probe with shielding element for measuring the thickness of thin layers

The invention relates to a measuring probe for non-destructive measuring of the thickness of thin layers, in particular in cavities, which are accessible by an opening or on curved surfaces, with a measuring head, which comprises at least one sensor element and at least one contact spherical cap, assigned to the sensor element on a surface, to be checked, of the cavity, and with a gripping element for positioning and guiding the measuring probe on and/or along the surface to be measured, wherein on the gripping element, a long, elastically yielding guide bar is provided, which accepts the at least one measuring head on its end opposing the gripping element, in such a way that it is moveable with at least one degree of freedom in relation to the guide bar.

The invention relates to a measurement stand for holding a measuring probe intended in particular for measuring the thickness of thin layers, and to a method for controlling the measurement stand.

Measurement stand and method of its electrical control

Method for emitting measuring values on a display () for a display device. According to the method, the measuring values that are recorded by a measuring device () on at least one test object () are forwarded to a signal processing device; a measuring value is detected at each measuring point (-) on the test object (), or a plurality of measuring values are detected at each measuring point (-) on the test object (); the average value is determined at each measuring point (-), from the number of detected measuring values; the average values of the respective measuring points (-) on at least one test object () are sorted according to the rank thereof in an evaluation device including an electronic calculator; and the average values are represented on the display () together with an upper and a lower boundary line.

Method for outputting measured values and display device

The invention relates to a method and a device for measuring the thickness of thin layers over large-area surfaces to be measured (), in which at least one measuring probe (), which comprises at least one sensor element () and at least one contact spherical cap () associated with the sensor element (), is applied to the surface to be measured () in order to obtain a measured value, wherein the large-area surface to be measured () is subdivided into individual partial areas (), a matrix of measurement points () is determined for each partial area () to be inspected, measured values are ascertained at equidistant measurement points () along at least one row () of the matrix of the partial area () using a device () carrying the at least one measuring probe (), and the measured values are ascertained successively for all rows () in the matrix in the partial area () and evaluated for this partial area ().

Method and device for measuring the thickness of thin layers over large-area surfaces to be measured

The invention relates to a method and an apparatus for measurement of the thickness of thin layers by means of a measurement probe () which has a housing () which holds at least one sensor element () whose longitudinal axis lies in particular on a longitudinal axis () of the housing (), in which at least during the measurement process, a gaseous medium is supplied to a supply opening () of the measurement probe () on a measurement surface (), and is supplied via at least one connection channel (), which is connected to the supply opening (), to one or more outlet openings () which are provided on an end face (), pointing towards the measurement surface (), of the measurement probe (), and in which at least one mass flow, which flows out of one or more outlet openings (), of the gaseous medium is directed at the measurement surface (), and in which the measurement probe () is held in a non-contacting manner with respect to the measurement surface () during the measurement process.

Method and apparatus for measurement of the thickness of thin layers by means of measurement probe

A measurement stand for holding a measuring device (), in particular a measuring arrangement () for measuring the thickness of thin layers, said measurement stand comprising a housing () in which a cam follower () is guided such that it can be moved up and down and the measuring device () is arranged at that end of said housing () that faces the measuring object (), wherein a drive unit () with an electric drive () drives the lifting movement of the cam follower (), wherein said drive unit () initiates in the down movement at least one first movement phase with a rapid motion and at least one further movement phase of the cam follower () with a creep motion until the measuring device () touches down on the measuring object ().

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Oberägeri, Switzerland

Helmut Fischer