This inventor holds 8 USPTO granted patents. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 1992-2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1992-2001
Title: Haruhiko Yokoyama: Innovator in Electronic Component Inspection
Introduction
Haruhiko Yokoyama is a notable inventor based in Osaka, Japan. He has made significant contributions to the field of electronic components, holding a total of 8 patents. His work primarily focuses on methods for inspecting the appearance of electronic parts, which is crucial for ensuring quality and reliability in electronic devices.
Latest Patents
Yokoyama's latest patents include an innovative appearance inspection method for electronic parts. This method detects the presence of unevenness in the outline of electronic components. By extracting an approximately square-shaped outline of the component under inspection, the method differentiates this outline and determines the presence of unevenness based on the absolute value of the difference between the maximum and minimum differential values and their median.
Another significant patent is a flaw detection apparatus that utilizes digital image data indicative of an object's surface. This apparatus detects flaws on the surface by identifying regions that consist of groups of pixels through image processing techniques. The image processor detects the extending direction of each region based on its contour line, allowing for the clustering of regions that extend in the same direction. This results in a flaw signal that indicates the sizes of the clustered regions.
Career Highlights
Haruhiko Yokoyama is associated with Matsushita Electric Industrial Co., Ltd., a leading company in the electronics industry. His work at this company has been instrumental in advancing inspection technologies for electronic components.
Collaborations
Yokoyama has collaborated with notable coworkers, including Masaya Nakao and Akira Kobayashi. Their combined efforts have contributed to the development of innovative solutions in the field of electronic component inspection.
Conclusion
Haruhiko Yokoyama's contributions to the field of electronic components through his patents and collaborations highlight his role as a significant innovator. His work continues to impact the quality assurance processes in the electronics industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
