The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 1996
Filed:
May. 25, 1994
Noriyuki Suzuki, Neyagawa, JP;
Haruhiko Yokoyama, Osaka, JP;
Matsushita Electric Industrial Co., Ltd., Kadoma, JP;
Abstract
A dot pattern-examining apparatus examines a dot pattern displayed on a display screen by picking up a two-dimensional image of the display screen and by performing image processing with respect to the dot pattern on the two-dimensional image. An image projection data generating section generates image projection data indicative of a set of density values by accumulating, on a predetermined axis, density values of individual dots of the two-dimensional image of the display screen for each line. Then, a run-length data generating section generates run-length data indicative of a set of combinations of an accumulated density value and a length thereof, based on the image projection data of the two-dimensional image. Thereafter, a run-length data matching section compares the run-length data of the two-dimensional image with a reference run-length data indicating a reference dot pattern and generated in advance by the run-length data generating section, to thereby determine a position having run-length data which most match the reference run-length data as the position where the dot pattern to be examined exists.