The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 1994
Filed:
Jul. 14, 1992
Haruhiko Yokoyama, Osaka, JP;
Masaya Nakao, Kadoma, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
An appearance inspecting method includes the steps of dividing a recognized image of an object into regions based on two attributes of image points within the image calculating the minimum distance of each point within a target region to a periphery of the target region, and measuring a size of the target region from the maximum of the calculated minimum distances of the points in the target region. A distance measuring method for measuring a distance of each point within a region to a periphery of the region includes the steps of dividing each region to be measured by lines made of picture elements arranged in one direction, sequentially integrating the distance of each point from the periphery of the region from its outer side to a middle point in each line from one end line to the other end line of the region to thereby obtain the minimum distance of each point, and the distance of each point from the periphery of the region is sequentially integrated from its outer side to the middle point in each line from the other end line to the one end line of the region to thereby obtain the minimum distance of each point.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile