The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2001
Filed:
Aug. 14, 1998
Applicant:
Inventors:
Haruhiko Yokoyama, Osaka, JP;
Masatoshi Nakamura, Nishinomiya, JP;
Assignee:
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/48 ; G06K 9/56 ;
U.S. Cl.
CPC ...
G06K 9/48 ; G06K 9/56 ;
Abstract
An external appearance inspection method for electronic components for detecting the presence of unevenness in the outline thereof. An approximately square-shaped outline (,) of an electronic component under inspection is extracted, this outline (,) is differentiated, and the presence of unevenness in the outline (,) is determined according to the absolute value of the difference between the maximum and minimum values (,) of the differential values and the median (,) thereof.
Yokoyama, Haruhiko. (2001). Appearance inspection method for electronic parts (U.S. Patent No. 6240202). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6240202
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile