The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 1998
Filed:
Jan. 16, 1998
Applicant:
Inventors:
Haruhiko Yokoyama, Osaka, JP;
Akira Kobayashi, Osaka, JP;
Assignee:
Matsushita Electric Industrial Co., Ltd., Osaka-fu, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382149 ; 348128 ; 356237 ; 382108 ; 382288 ;
Abstract
A flaw detection apparatus detects a flaw formed on an object's surface based on a digital image data indicative of said object's surface as a group of plural pixels utilizing the image processing technique. An image processor is provided for detecting a direction in which each of group extends to combine a plurality of groups extending in substantially the same direction. The image processor further produces a flaw signal indicating sizes of thus combined groups.
Yokoyama, Haruhiko. (1998). Flaw detection apparatus (U.S. Patent No. 5850468). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5850468
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