The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 14, 2000
Filed:
Jul. 25, 1997
Haruhiko Yokoyama, Osaka, JP;
Akira Kobayashi, Osaka, JP;
Matsushita Electric Industrial Co. Ltd., Osaka-fu, JP;
Abstract
A flaw detection apparatus detects a flaw formed on an object's surface based on a digital image data indicative of said object's surface as regions which are groups of plural pixels utilizing the image processing technique. An image processor is provided for detecting an extending direction in which each region extends based on a contour line of each region, so that regions extending in the same direction are clustered as one region. The image processor further produces a flaw signal indicating sizes of thus clustered regions.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile