Glen P Gilfeather

This inventor holds 20 USPTO granted patents. Top assignees: Advanced Micro Devices Corporation, Advanced Mircor Devices, Inc., Semicaps Pte Ltd. Active years: 1989-2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Glen P Gilfeather. Retrieved from https://idiyas.com/inventor/glen-p-gilfeather

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 20

% Patents Active = 75.0

Average Co-Inventor Count = 3.0

ph-index = 7

Forward Citations = 184(Granted Patents)

Location History:

Austin, TX (US) (1989)
De Valle, TX (US) (2004)
Del Valle, TX (US) (1999 - 2006)

Company Filing History:

19 out of 13,161

Advanced Micro Devices Corporation

patents

1 out of 1

Advanced Mircor Devices, Inc.

where one patent can have more than one assignee

Years Active: 1989-2006

Loading Chart...

20 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7088852 - Three-dimensional tomography (2006-08-08),

2. 6897664 - Laser beam induced phenomena detection (2005-05-24),

3. 6844928 - Fiber optic semiconductor analysis arrangement and method therefor (2005-01-18),

4. 6833718 - Photon beacon (2004-12-21),

5. 6716683 - Optical analysis for SOI integrated circuits (2004-04-06),

6. 6700659 - Semiconductor analysis arrangement and method therefor (2004-03-02),

7. 6661246 - Constant-current VDDQ testing of integrated circuits (2003-12-09),

8. 6635839 - Semiconductor analysis arrangement and method therefor (2003-10-21),

9. 6566888 - Repair of resistive electrical connections in an integrated circuit (2003-05-20),

10. 6518661 - Apparatus for metal stack thermal management in semiconductor devices (2003-02-11),

11. 6469529 - Time-resolved emission microscopy system (2002-10-22),

12. 6455334 - Probe grid for integrated circuit analysis (2002-09-24),

13. 6372627 - Method and arrangement for characterization of focused-ion-beam insulator deposition (2002-04-16),

14. 6352871 - Probe grid for integrated circuit excitation (2002-03-05),

15. 6285036 - Endpoint detection for thinning of silicon of a flip chip bonded integrated circuit (2001-09-04),

Title: Glen P. Gilfeather: Pioneering Innovator in Semiconductor Technology

Introduction

Glen P. Gilfeather, based in De Valle, Texas, is a notable inventor with an impressive portfolio of 20 patents that showcase his contributions to the field of semiconductor technology. His inventions have played a critical role in advancing the capabilities of defect analysis and inspection processes within the semiconductor industry.

Latest Patents

Among his latest innovations, Glen is credited with two significant patents. The first is focused on **Three-dimensional tomography**, which enhances defect analysis of semiconductor dies. This invention allows for the viewing of defects from virtually any angle by removing the substrate from the die and simultaneously capturing images of the affected portions. These images are combined to create a comprehensive three-dimensional view, facilitating a more in-depth examination of the nature of defects.

The second patent relates to **Laser beam induced phenomena detection**. This technology encompasses an apparatus and methods for inspecting circuit structures using a laser scanning microscope. The invention includes a system that establishes power conditions in circuit structures, detects changes induced by laser illumination, processes these signals, and executes a controlled scanning pattern. This method enhances the inspection capabilities of semiconductor devices, enabling more precise identification of alterations.

Career Highlights

Glen P. Gilfeather has made significant strides in his career, having worked with reputable organizations such as Advanced Micro Devices Corporation (AMD) and Semicaps Pte Ltd. His tenure at these companies has allowed him to leverage his expertise in semiconductor technology, contributing to the development and refinement of innovative solutions in the field.

Collaborations

Throughout his career, Glen has collaborated with distinguished professionals, including Michael R. Bruce and Rama Rao Goruganthu. These partnerships have undoubtedly enriched his work, fostering an environment of creativity and innovation that has led to the development of groundbreaking technologies.

Conclusion

Glen P. Gilfeather's contributions to semiconductor technology through his numerous patents illustrate his dedication and innovative spirit. His advancements in defect analysis and inspection techniques are vital for the continued evolution of the semiconductor industry, paving the way for future technologies and improvements.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]