The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2003
Filed:
Oct. 23, 2000
Applicant:
Inventor:
Glen Patrick Gilfeather, Del Valle, TX (US);
Assignee:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/126 ;
U.S. Cl.
CPC ...
G01R 3/126 ;
Abstract
Integrated circuit analysis is enhanced via a method and system for detecting defects associated with particular logic states of an integrated circuit. According to an example embodiment of the present invention, a constant current supply is applied to an integrated circuit. The voltage across the constant current supply is detected for each of a plurality of clock cycles of the integrated circuit, each clock cycle being representative of a logic state of the integrated circuit. The voltage detected at each clock cycle is compared, and the comparison is used to analyze the integrated circuit for a defect.