Georg Erhard Eggers

Title: Georg Erhard Eggers: Innovator in Semiconductor Memory Testing

Introduction

Georg Erhard Eggers is a prominent inventor based in Munich, Germany. He has made significant contributions to the field of semiconductor memory testing, holding a total of 10 patents. His innovative approaches have paved the way for advancements in memory chip technology.

Latest Patents

One of Eggers' latest patents is a method and apparatus for testing a memory chip using a common node for multiple inputs and outputs. This invention provides an apparatus and methods for testing an integrated device that comprises memory and a test device. In this design, at least two data inputs of the memory are coupled to a data output of the test device, allowing for efficient data transfer and fault identification. Another notable patent is related to integrated semiconductor memory and a method for electrically stressing an integrated semiconductor memory. This invention addresses the issues of segmented word lines in semiconductor memories, enabling the electrical stressing of contact hole fillings to prevent functional errors.

Career Highlights

Throughout his career, Georg Erhard Eggers has worked with leading companies in the semiconductor industry, including Infineon Technologies AG and Qimonda AG. His expertise in memory technology has been instrumental in the development of innovative solutions that enhance the performance and reliability of semiconductor devices.

Collaborations

Eggers has collaborated with notable professionals in the field, including Manfred Pröll and Stephan Schröder. These partnerships have contributed to the advancement of technology in semiconductor memory testing.

Conclusion

Georg Erhard Eggers is a distinguished inventor whose work in semiconductor memory testing has led to significant innovations. His patents reflect a deep understanding of memory technology and a commitment to improving device performance.