The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2007
Filed:
Aug. 21, 2002
Eric Cordes, Chapel Hill, NC (US);
Christian Stocken, Munich, DE;
Georg Erhard Eggers, Munich, DE;
Jens Luepke, Ottobrunn, DE;
Eric Cordes, Chapel Hill, NC (US);
Christian Stocken, Munich, DE;
Georg Erhard Eggers, Munich, DE;
Jens Luepke, Ottobrunn, DE;
Infineon Technologies AG, Munich, DE;
Abstract
A test method for a semiconductor memory device having a bidirectional data strobe terminal for a data strobe signal, and having at least one data terminal for a data signal at a test apparatus, which can at least generate data strobe and data signals and also transfer and evaluate data signals. The memory device is connected to a test apparatus, which generates data strobe and data signals, and transfers and evaluates data signals. In the course of the test using the data strobe and data signals, data are transferred from the first semiconductor memory device to a second semiconductor memory device of identical type and are evaluated after a read-out from the second semiconductor memory device by the test apparatus.