The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 25, 2011
Filed:
Nov. 02, 2007
Joerg Kliewer, Munich, DE;
Manfred Proell, Dorfen, DE;
Stephan Schroeder, Munich, DE;
Georg Eggers, Munich, DE;
Wolfgang Ruf, Friedberg, DE;
Hermann Hass, Hoehenkirchen-Siegertsbrunn, DE;
Joerg Kliewer, Munich, DE;
Manfred Proell, Dorfen, DE;
Stephan Schroeder, Munich, DE;
Georg Eggers, Munich, DE;
Wolfgang Ruf, Friedberg, DE;
Hermann Hass, Hoehenkirchen-Siegertsbrunn, DE;
Qimonda AG, Munich, DE;
Abstract
An apparatus and methods for testing an integrated device comprising memory a test device are provided. At least two data inputs of the memory are coupled to a data output of the test device. As an alternative, at least two data outputs of the memory are coupled to a data input of the test device. Test data are transferred from the test device to the memory chip and written to memory cells of the memory. Data are read from the memory cells of the memory and transferring from the memory to the test device. The data read from the memory chip are compared with the test data written to the memory in order to identify faults of the memory.