Stephan Schroeder

Title: The Innovations of Stephan Schroeder

Introduction

Stephan Schroeder is a prominent inventor based in Munich, Germany. He has made significant contributions to the field of integrated device testing, holding a total of 13 patents. His work focuses on enhancing the efficiency and accuracy of memory chip testing.

Latest Patents

One of his latest patents is a method and apparatus for testing a memory chip using a common node for multiple inputs and outputs. This invention provides an innovative approach to testing integrated devices that comprise memory. The apparatus allows for at least two data inputs of the memory to be coupled to a data output of the test device, facilitating the transfer of test data to the memory chip. The data written to the memory cells can then be read and compared with the test data to identify any faults in the memory. Another notable patent involves an integrated device for simplified parallel testing, which includes a functional circuit and a test circuit that provides error data. This design enhances the testing process by storing and outputting error data efficiently.

Career Highlights

Stephan has worked with leading companies in the technology sector, including Infineon Technologies AG and Qimonda AG. His experience in these organizations has allowed him to develop and refine his innovative ideas in memory testing technology.

Collaborations

Throughout his career, Stephan has collaborated with notable professionals in the field, including Manfred Proell and Joerg Kliewer. These collaborations have contributed to the advancement of his inventions and the overall progress in integrated device testing.

Conclusion

Stephan Schroeder's contributions to the field of memory chip testing are noteworthy, with his innovative patents paving the way for improved testing methodologies. His work continues to influence the industry and enhance the reliability of integrated devices.