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For the Inventor, By the Inventor

Hopewell Junction, NY, United States of America

Gary Walter Behm

USPTO Granted Patents = 16 

Average Co-Inventor Count = 3.4

ph-index = 5

Forward Citations = 96(Granted Patents)


Location History:

  • Hopewell Junction, NY (US) (2006 - 2013)
  • West Henrietta, NY (US) (2014 - 2021)

Company Filing History:

goldMedal15 out of 164,197 
 
International Business Machines Corporation
 patents
silverMedal1 out of 157 
 
Rochester Institute of Technology
 patents

Years Active: 2006-2021

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16 patents (USPTO):Explore Patents
1. 11012559 - Method and system to enhance communication between multiple parties (2021-05-18),
2. 8842021 - Methods and systems for early warning detection of emergency vehicles (2014-09-23),
3. 8565910 - Manufacturing execution system (MES) including a wafer sampling engine (WSE) for a semiconductor manufacturing process (2013-10-22),
4. 8229691 - Method for using real-time APC information for an enhanced lot sampling engine (2012-07-24),
5. 8130262 - Apparatus and method for enhancing field of vision of the visually impaired (2012-03-06),
6. 8077020 - Method and apparatus for tactile haptic device to guide user in real-time obstacle avoidance (2011-12-13),
7. 7899566 - Factory level and tool level advanced process control systems integration implementation (2011-03-01),
8. 7895008 - Method of performing measurement sampling of lots in a manufacturing process (2011-02-22),
9. 7778112 - Apparatus and method for sensing of three-dimensional environmental information (2010-08-17),
10. 7700378 - Method and system for line-dimension control of an etch process (2010-04-20),
11. 7577537 - Providing a dynamic sampling plan for integrated metrology (2009-08-18),
12. 7509186 - Method and system for reducing the variation in film thickness on a plurality of semiconductor wafers having multiple deposition paths in a semiconductor manufacturing process (2009-03-24),
13. 7489980 - Factory level and tool level advanced process control systems integration implementation (2009-02-10),
14. 7398172 - Method and system of providing a dynamic sampling plan for integrated metrology (2008-07-08),
15. 7291285 - Method and system for line-dimension control of an etch process (2007-11-06),
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