The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 22, 2011
Filed:
Mar. 17, 2008
Gary W. Behm, Hopewell Junction, NY (US);
Yue LI, Hopewell Junction, NY (US);
Malek Ben Salem, Wappingers Falls, NY (US);
Keith Tabakman, Fishkill, NY (US);
Gary W. Behm, Hopewell Junction, NY (US);
Yue Li, Hopewell Junction, NY (US);
Malek Ben Salem, Wappingers Falls, NY (US);
Keith Tabakman, Fishkill, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of performing measurement sampling in a production process includes passing a lot through a manufacturing process, employing a set of combinational logistics to determine if sampling is indicated and, if sampling is indicated, establishing a sampling decision. The method further requires querying a set of lot sampling rules to evaluate the sampling decision, evaluating a statistical quality of the process if no lot sampling rules exist, and automatically determining whether the lot passing through the production process requires sampling based on the combinational logistics, statistical quality and lot sampling rules.