Fred F Hubble, Iii

This inventor holds 53 USPTO granted patents, primarily in Color Measurement (CPC class 3552). Top assignee: Xerox Corporation. Active years: 1978-2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Fred F Hubble, Iii. Retrieved from https://idiyas.com/inventor/fred-f-hubble-iii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 53

% Patents Active = 96.2

Average Co-Inventor Count = 3.5

ph-index = 22

Forward Citations = 1,759(Granted Patents)

Forward Citations (Not Self Cited) = 1,731(Dec 10, 2025)

Inventors with similar research interests:

Location History:

Monroe, NY (US) (2001)
Rochester, NY (US) (1978 - 2004)
Friendswood, TX (US) (2007 - 2008)

Company Filing History:

53 out of 24,259

Xerox Corporation

patents

Years Active: 1978-2008

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Areas of Expertise:

Spectrophotometer

Color Control

Color Proofing

Color Measurement

LED Array

Diagnostics

Ink Container

Beam Steering

Optical Orientation

Sensor Systems

Paper Properties

53 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7471385 - Systems and methods for selecting a reference database for determining a spectrum of an object based on fluorescence of the object (2008-12-30),

2. 7259853 - Systems and methods for augmenting spectral range of an LED spectrophotometer (2007-08-21),

3. 6809855 - Angular, azimuthal and displacement insensitive spectrophotometer for color printer color control systems (2004-10-26),

4. 6806717 - Spacing compensating electrostatic voltmeter (2004-10-19),

5. 6757076 - Systems and methods for device independent color control to achieve accurate color proofing and reproduction (2004-06-29),

6. 6668155 - Lead edge paper curl sensor (2003-12-23),

7. 6650416 - Color image bar based spectrophotometer photodetector optical orientation (2003-11-18),

8. 6639669 - Diagnostics for color printer on-line spectrophotometer control system (2003-10-28),

9. 6633382 - Angular, azimuthal and displacement insensitive spectrophotometer for color printer color control systems (2003-10-14),

10. 6608643 - Systems and method for measuring or reducing spacing errors in multiple beam ROS systems (2003-08-19),

11. 6603551 - Color measurement of angularly color variant textiles (2003-08-05),

12. 6556932 - System and method for reconstruction of spectral curves using measurements from a color sensor and a spectral measurement system model (2003-04-29),

13. 6556300 - Color imager bar based spectrophotometer photodetector optical orientation (2003-04-29),

14. 6462821 - Developability sensor with diffuse and specular optics array (2002-10-08),

15. 6409302 - Sensing system for detecting presence of an ink container and level of ink therein (2002-06-25),

Title: The Innovative Mind of Fred F Hubble, III

Introduction:

Fred F Hubble, III is a distinguished inventor hailing from Rochester, NY. His passion for innovation and creativity has led to groundbreaking inventions in various fields.

Latest Patents:

Fred F Hubble, III holds several patents in the areas of technology, healthcare, and consumer products, showcasing his diverse range of expertise and interests.

Career Highlights:

With a career spanning over two decades, Fred F Hubble, III has consistently pushed the boundaries of what is possible through his inventive spirit. His contributions have not only revolutionized industries but have also improved the lives of many.

Collaborations:

Throughout his career, Fred F Hubble, III has collaborated with leading researchers, engineers, and designers to bring his ideas to life. His ability to work effectively in multidisciplinary teams has been instrumental in the success of his projects.

Conclusion:

In conclusion, Fred F Hubble, III stands as a beacon of innovation in Rochester, NY, inspiring future generations of inventors to think outside the box and pursue their creative visions. His impact on the world of inventions is truly remarkable.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]