The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 18, 2003

Filed:

Dec. 04, 2002
Applicant:
Inventors:

Jagdish C. Tandon, Fairport, NY (US);

Lingappa K. Mestha, Fairport, NY (US);

Fred F. Hubble, III, Rochester, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/125 ;
U.S. Cl.
CPC ...
G01N 2/125 ;
Abstract

A color spectrophotometer incorporating a low cost commercial imaging chip, which normally forms part of a document imaging bar used for imaging documents in scanners, etc., having multiple photo-sites with three different rows of color filters. Each chip is mounted on the optical axis of an imaging lens system, in the image plane of that lens system, to image the reflected illumination from an illuminated color test target area on the chip. The optical axis of the imaging lens system is oriented at 45° to the illuminated color test patches, and the photodetector chip is physically mounted perpendicular to the plane of the illuminated color test patches. Respective photo-sensor chips and associated 1:1 optics may be mounted on opposing sides of the spectrophotometer physically oriented at 90° to the test target area plane receiving the reflected light from the test target optically oriented at 45° to the illuminated test target.


Find Patent Forward Citations

Loading…