The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2003
Filed:
Nov. 28, 2001
Lalit K. Mestha, Fairport, NY (US);
Fred F. Hubble, III, Rochester, NY (US);
Tonya L. Love, Rochester, NY (US);
Daniel A. Robbins, Williamson, NY (US);
Gary W. Skinner, Rochester, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
A method is provided for measuring the color of irregular surface materials, including textiles which may provide dissimilar color measurements from different viewing angles, by illuminating a sampling area of the irregular surface material approximately perpendicularly thereto and measuring the color reflected from that area at a substantial angle, preferably about 45 degrees, with a plurality of separate photodetectors arrayed circularly around the illuminated sampling area of irregular surface material to receive the reflected illumination from substantially opposing directions and at a substantial angle to the illuminated area, for providing a more accurate yet lower cost color measurement system for textiles that can be used easily, quickly, and uncritically in terms of the handling, positioning and orientation of the textile material being tested.