The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 08, 2002
Filed:
Apr. 20, 2000
Michael D. Borton, Ontario, NY (US);
Fred F. Hubble, III, Rochester, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
A developability sensing system with an optical sensor for measuring the density of imaging material samples on an imaging surface of a printer, with an illumination source and photosensor system for measuring the amount of reflected illumination from the imaging materials. A first lens system and its first photosensor may receive both specularly and diffusely reflected illumination from certain imaging materials. A separate lenslet system is positioned outside of the first lens system. It may comprise one to four spaced apart generally cylindrical lenslets with a central axis generally perpendicular to the imaging material sample and an end surface facing the imaging material sample defined by a segment of a hyperbolic curved surface to form a rotationally symmetrical lens with a hyperbolic cross-section. There are separate photosensors for these lenslets, which are positioned and optically adapted to only receive diffusely reflected light from the imaging material sample, even though reflected illumination from the imaging material sample has both specularly and diffusely reflected illumination from partially specularly reflective imaging materials.