The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 28, 2003

Filed:

Sep. 10, 2001
Applicant:
Inventors:

Fred F. Hubble, III, Rochester, NY (US);

Tonya L. Love, Rochester, NY (US);

Lalit K. Mestha, Fairport, NY (US);

Gary W. Skinner, Rochester, NY (US);

Dennis M. Diehl, Penfield, NY (US);

Robert E. Grace, Fairport, NY (US);

Eric Jackson, Penfield, NY (US);

Yao Rong Wang, Webster, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/42 ; G01J 3/46 ;
U.S. Cl.
CPC ...
G01J 3/42 ; G01J 3/46 ;
Abstract

In a color analysis method in which sheets with multiple different color printed test patches are moved relative to a color analyzing spectrophotometer, and in which fiducial marks are printed adjacent to respective test patches and optically detected by a fiducial mark detector to provide a triggering system for the respective test patch analysis, there is provided automatic diagnostic testing of the spectrophotometer and the fiducial mark triggering system, including automatically generating special test sheets, some of which may include test areas of varying density black.


Find Patent Forward Citations

Loading…