Company Filing History:
2 out of 4,896 
1 out of 4 Years Active: 2023-2025
Title: Innovator Spotlight: Filippo Alpeggiani, The Mind Behind Advanced Metrology Methods
Introduction:
Filippo Alpeggiani is an accomplished inventor based in Eindhoven, Netherlands, making significant strides in the field of metrology. With a portfolio boasting 2 patents, Alpeggiani's groundbreaking work is revolutionizing the way we approach alignment metrology and lithographic apparatuses.
Latest Patents:
Alpeggiani's latest patents include a metrology method and alignment method that have been instrumental in advancing measurement techniques in the industry. The metrology method involves obtaining pupil plane measurement dataset to determine measurement values or corrections related to scattered radiation, while the alignment method focuses on determining stage positions in lithographic processes using transmission and position data.
Career Highlights:
Currently affiliated with ASML Netherlands B.V., one of the leading companies in the semiconductor industry, Alpeggiani has been instrumental in developing cutting-edge technologies for precision measurement and alignment. His expertise and innovative approach have earned him recognition as a pioneer in the field.
Collaborations:
Collaborating with esteemed colleagues such as Sebastianus Adrianus Goorden and Simon Reinald Huisman, Alpeggiani has been part of a dynamic team driving innovation and excellence in metrology research. Together, they have spearheaded projects that have set new standards in the industry.
Conclusion:
Filippo Alpeggiani's dedication to pushing the boundaries of metrology technology highlights his commitment to excellence and innovation. His innovative patents and collaborative efforts continue to shape the future of precision measurement, solidifying his position as a prominent figure in the field.