The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 29, 2025

Filed:

Dec. 02, 2021
Applicants:

Asml Netherlands B.v., Veldhoven, NL;

Asml Holding N.v., Veldhoven, NL;

Inventors:

Arjan Johannes Anton Beukman, Son en Breugel, NL;

Sebastianus Adrianus Goorden, Eindhoven, NL;

Stephen Roux, New Fairfield, CT (US);

Sergei Sokolov, Eindhoven, NL;

Filippo Alpeggiani, Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/00 (2005.12); G03F 9/00 (2005.12);
U.S. Cl.
CPC ...
G03F 9/7065 (2012.12); G03F 7/70625 (2012.12); G03F 9/7046 (2012.12);
Abstract

A method includes irradiating a target structure with sequential illumination shots, directing scattered beams from the target structure towards an imaging detector, generating a detection signal using the imaging detector, and determining a property of the target structure based on at least the detection signal. An integration time for each illumination shot of the sequential illumination shots is selected so to reduce a low frequency error.


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