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For the Inventor, By the Inventor

Boise, ID, United States of America

Eric Higgins Freeman

USPTO Granted Patents = 36


Average Co-Inventor Count = 1.9

ph-index = 10

Forward Citations = 279(Granted Patents)


Location History:

  • Kuna, ID (US) (2009 - 2023)
  • Boise, ID (US) (2021 - 2024)

Company Filing History:

goldMedal35 out of 37,905 
 
Micron Technology Incorporated
 patents
silverMedal1 out of 832,680 
Other
 patents

Years Active: 2009-2024

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36 patents (USPTO):Explore Patents
1. 11978680 - Method and apparatus for on-chip stress detection (2024-05-07),
2. 11784058 - Integrated structures, capacitors and methods of forming capacitors (2023-10-10),
3. 11189536 - Method and apparatus for on-chip stress detection (2021-11-30),
4. 11087991 - Integrated structures, capacitors and methods of forming capacitors (2021-08-10),
5. 10930585 - Memory devices, semiconductor devices and related methods (2021-02-23),
6. 10910310 - Methods of forming semiconductor devices (2021-02-02),
7. 10910306 - Devices including vias extending through alternating dielectric materials and conductive materials, and related electronic devices (2021-02-02),
8. 10879265 - Microelectronic devices and related methods (2020-12-29),
9. 10872951 - Semiconductor devices including capacitor structures having improved area efficiency (2020-12-22),
10. 10756014 - Devices including vias extending through alternating dielectric materials and conductive materials, and related methods (2020-08-25),
11. 10373974 - Microelectronic devices and related methods (2019-08-06),
12. 10373904 - Semiconductor devices including capacitors, related electronic systems, and related methods (2019-08-06),
13. 10366901 - Integrated structures, capacitors and methods of forming capacitors (2019-07-30),
14. 10325847 - Semiconductor devices including stair-step structures (2019-06-18),
15. 10297659 - Memory devices including capacitor structures having improved area efficiency (2019-05-21),

Title: The Innovative Journey of Eric Higgins Freeman

Introduction

Eric Higgins Freeman, an accomplished inventor based in Boise, ID, has made significant contributions to the field of microelectronics. With a remarkable portfolio of 36 patents, Freeman's work has been pivotal in enhancing the functionality and efficiency of microelectronic devices.

Latest Patents

Freeman's latest inventions include a groundbreaking Method and Apparatus for On-chip Stress Detection. This innovation integrates multiple on-chip strain sensors (OCSSs) within a semiconductor substrate. These sensors, equipped with piezoresistive devices, are designed to detect strain at various locations and generate strain signals for mechanical stress analysis on the chip device. Additionally, he has developed integrated structures and methods for forming capacitors that incorporate an insulative frame and conductive plates, further advancing semiconductor technology.

Career Highlights

Over the years, Eric has spent a significant part of his career at Micron Technology Incorporated, a leader in semiconductor manufacturing. His work has not only contributed to his personal patent portfolio but has also driven advancements within the company and the industry at large.

Collaborations

Freeman's career has been enriched by collaborations with other talented professionals such as Michael A. Smith and Luan C. Tran. Together, they have worked on various projects that reflect their shared commitment to innovation in the field of microelectronics.

Conclusion

Eric Higgins Freeman remains a notable figure in the realm of technological innovations, demonstrating a continuous pursuit of excellence in microelectronics. His patents not only showcase his inventive prowess but also highlight the potential for future advancements within the industry.

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