Company Filing History:
Years Active: 2006-2009
Title: Innovator Spotlight: Eric Bouche - Advancing Metrology and Electrical Characteristic Measurement
Introduction:
Eric Bouche, an innovative inventor based in Pleasanton, CA, has made significant strides in the field of metrology and electrical characteristic measurement. With a keen eye for detail and a passion for precision, Bouche has secured four patents that have revolutionized the way we approach quality control in semiconductor manufacturing.
Latest Patents:
1. Dynamic Measurement Control: This patent introduces a groundbreaking metrology recipe that enables a metrology tool to perform secondary metrology operations on test wafers based on previous measurement data. By selectively conducting more in-depth inspections only when necessary, Bouche's invention optimizes metrology throughput while ensuring critical data is accurately captured.
2. Corona-Based Charge Voltage Measurement: Bouche's method focuses on measuring the electrical characteristics of a gate dielectric by locally annealing the measurement area with a highly precise energy source. This technique allows for precise measurements using non-contact electrical probing, providing insights into the gate dielectric's properties without significantly impacting surrounding structures.
Career Highlights:
Currently affiliated with KLA-Tencor Technologies Corporation, Eric Bouche has been a key player in driving technological advancements in the semiconductor industry. His expertise in metrology and electrical characteristic measurement has contributed significantly to the company's success in maintaining high-quality standards in semiconductor production.
Collaborations:
During his tenure, Bouche has collaborated with esteemed colleagues such as Gary Janik and Sergio Edelstein. Together, they have explored innovative solutions and pushed the boundaries of technology in semiconductor metrology, showcasing the power of teamwork in driving meaningful advancements.
Conclusion:
Eric Bouche's dedication to innovation and his pioneering contributions to metrology and electrical characteristic measurement have solidified his reputation as a prominent inventor in the semiconductor industry. His relentless pursuit of excellence continues to inspire fellow innovators and shape the future of semiconductor manufacturing.