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For the Inventor, By the Inventor

Austin, TX, United States of America

Donald George Mikan, Jr

USPTO Granted Patents = 29 

Average Co-Inventor Count = 2.6

ph-index = 8

Forward Citations = 314(Granted Patents)


Company Filing History:

goldMedal21 out of 164,108 
 
International Business Machines Corporation
 patents
silverMedal5 out of 40,635 
 
Taiwan Semiconductor Manufacturing Comp. Ltd.
 patents
bronzeMedal3 out of 29,232 
 
Texas Instruments Corporation
 patents

Years Active: 1996-2025

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29 patents (USPTO):
1. 12436858 - Scan synchronous-write-through testing architectures for a memory device (2025-10-07),
2. 11734142 - Scan synchronous-write-through testing architectures for a memory device (2023-08-22),
3. 11256588 - Scan synchronous-write-through testing architectures for a memory device (2022-02-22),
4. 10705934 - Scan synchronous-write-through testing architectures for a memory device (2020-07-07),
5. 8502564 - Adjustable Schmitt trigger (2013-08-06),
6. 8248867 - Memory cell employing reduced voltage (2012-08-21),
7. 7864600 - Memory cell employing reduced voltage (2011-01-04),
8. 7660150 - Memory cell having improved write stability (2010-02-09),
9. 6737888 - Method for skipping a latch in timing-sensitive dynamic circuits of a multi-clocked system with unspecific underlap requirement (2004-05-18),
10. 6667637 - Dynamic logic circuit with beta controllable noise margin (2003-12-23),
11. 6532544 - High gain local clock buffer for a mesh clock distribution utilizing a gain enhanced split driver clock buffer (2003-03-11),
12. 6445236 - Master-slave flip-flop circuit with embedded hold function and method for holding data in a master-slave flip-flop circuit (2002-09-03),
13. 6240536 - Scanable latch circuit and method for providing a scan output from a latch circuit (2001-05-29),
14. 6157216 - Circuit driver on SOI for merged logic and memory circuits (2000-12-05),
15. 6144325 - Register file array having a two-bit to four-bit encoder (2000-11-07),

Title: Inventor Spotlight: Donald George Mikan, Jr.

Introduction:

Donald George Mikan, Jr., a prolific inventor based in Austin, Texas, has made significant contributions to the field of memory devices and electronic testing. With an impressive portfolio of 29 patents, Mikan's innovative solutions have paved the way for advancements in testing architectures for memory devices.

Latest Patents:

One of Mikan's recent patents is the "Scan synchronous-write-through testing architectures for a memory device." This testing environment allows for the thorough examination of memory devices and electronic systems to identify manufacturing faults. The operation modes include shift, capture, and scan modes, ensuring comprehensive testing procedures.

Career Highlights:

Mikan has had a distinguished career, having worked with renowned companies such as International Business Machines Corporation (IBM) and Texas Instruments Corporation. His expertise and innovative approach have been instrumental in driving technological advancements in the industry.

Collaborations:

Throughout his career, Mikan has collaborated with esteemed professionals, including Michael Kevin Ciraula and Hugh Thomas Mair. These collaborations have led to the development of cutting-edge solutions and have further solidified Mikan's reputation as a leading figure in the field of memory devices and electronic testing.

Conclusion:

Donald George Mikan, Jr.'s dedication to innovation and problem-solving has resulted in groundbreaking inventions that have shaped the landscape of memory devices and electronic testing. His patents and contributions continue to inspire new developments in the industry, making him a true pioneer in his field.

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