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For the Inventor, By the Inventor

Fairfax, VT, United States of America

David P Vallett

This inventor holds 29 USPTO granted patents and 1 EPO patent, primarily in Semiconductor Technology. Top assignee: International Business Machines Corporation. Active years: 1999-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David P Vallett. Retrieved from https://idiyas.com/inventor/david-p-vallett

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 29

% Patents Active = 48.3


Average Co-Inventor Count = 2.7

ph-index = 10

Forward Citations = 304(Granted Patents)


Location History:

  • Fairfax, VA (US) (2003)
  • Fairfax, VT (US) (1999 - 2015)

Company Filing History:

goldMedal29 out of 166,409 
 
International Business Machines Corporation
 patents

Years Active: 1999-2015

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Areas of Expertise:
Chip Temperature Mapping
Nanoscale Fault Isolation
Integrated Circuit Sensors
Defect Monitoring
Fabrication Monitors
Backside Probing
Micro Probe Assembly
Die Thinning
Clock Shield Monitoring
VLSI Navigation
Power Bus Wiring
Scan Chain Design
29 patents (USPTO):Explore Patents
1. 9140669 - Mapping density and temperature of a chip, in situ (2015-09-22),
2. 8987843 - Mapping density and temperature of a chip, in situ (2015-03-24),
3. 7671604 - Nanoscale fault isolation and measurement system (2010-03-02),
4. 7620931 - Method of adding fabrication monitors to integrated circuit chips (2009-11-17),
5. 7511510 - Nanoscale fault isolation and measurement system (2009-03-31),
6. 7484423 - Integrated carbon nanotube sensors (2009-02-03),
7. 7397263 - Sensor differentiated fault isolation (2008-07-08),
8. 7323278 - Method of adding fabrication monitors to integrated circuit chips (2008-01-29),
9. 7285860 - Method and structure for defect monitoring of semiconductor devices using power bus wiring grids (2007-10-23),
10. 7247877 - Integrated carbon nanotube sensors (2007-07-24),
11. 7240322 - Method of adding fabrication monitors to integrated circuit chips (2007-07-03),
12. 7239167 - Utilizing clock shield as defect monitor (2007-07-03),
13. 7230335 - Inspection methods and structures for visualizing and/or detecting specific chip structures (2007-06-12),
14. 7202689 - Sensor differentiated fault isolation (2007-04-10),
15. 7194706 - Designing scan chains with specific parameter sensitivities to identify process defects (2007-03-20),

Title: The Innovative Journey of David P. Vallett

Introduction

David P. Vallett, an accomplished inventor based in Fairfax, Vermont, has made significant strides in the field of technology with an impressive portfolio of 29 patents. His contributions, particularly in the area of chip technology, underscore his commitment to advancing innovation in the industry.

Latest Patents

One of Vallett's most recent patents is centered around the method and system to map density and temperature of a chip, in situ. This innovative approach involves measuring the propagation time of a mechanical wave traveling along a predefined path in a substrate. By calculating an average substrate density and temperature based on this data, Vallett's method presents a way to identify defects or unauthorized modifications in the substrate by comparing average density to a baseline measure.

Career Highlights

David P. Vallett has had a notable career at International Business Machines Corporation (IBM), where he applies his expertise in materials science and engineering to develop cutting-edge technologies. His work has not only advanced IBM's capabilities but has also contributed to the broader field of chip design and reliability.

Collaborations

Throughout his career, Vallett has had the opportunity to collaborate with esteemed professionals such as John Maxwell Cohn and Thomas Gregory Sopchak. These partnerships highlight his ability to work effectively within a team to innovate and address complex technological challenges.

Conclusion

David P. Vallett represents the spirit of innovation and creativity in the tech industry. With his extensive patent portfolio and collaborative spirit, he continues to drive advancements that have the potential to shape the future of chip technology. His work serves as an inspiration for emerging inventors and a testament to the power of intellectual property in fostering innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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