Raleigh, NC, United States of America

David P Nackashi

This inventor holds 47 USPTO granted patents and 7 published patent applications and 4 EPO patents, primarily in Electron Microscopy. Top assignee: Protochips, Inc.. Active years: 2010-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David P Nackashi. Retrieved from https://idiyas.com/inventor/david-p-nackashi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 47 

% Patents Active = 91.5

 

Average Co-Inventor Count = 4.5

ph-index = 9

Forward Citations = 237(Granted Patents)


Company Filing History:


Years Active: 2010-2026

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Areas of Expertise:
Drift Correction
Sample Holder
Gas Delivery
Transmission Electron Microscope
MEMS Heating Platform
Microscopy Support Structures
Environmental Monitoring
Electrical Connection
Fluid Reservoirs
Specimen Mount
Temperature Control
47 patents (USPTO):Explore Patents

Title: The Inventor David P Nackashi: Pioneering Innovations in Raleigh

Introduction: David P Nackashi is a distinguished inventor based in Raleigh, NC, known for his groundbreaking contributions to various fields.

Latest Patents: David P Nackashi holds several patents in the areas of technology, healthcare, and consumer products, showcasing his diverse range of expertise.

Career Highlights: With a career spanning over two decades, David has consistently demonstrated a knack for identifying gaps in the market and developing innovative solutions to address them.

Collaborations: Throughout his career, David has collaborated with leading companies, research institutions, and universities to bring his inventions to life, further solidifying his reputation as a visionary inventor.

Conclusion: David P Nackashi's relentless pursuit of innovation and his passion for creating meaningful change continue to inspire the next generation of inventors.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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