The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 09, 2021

Filed:

Sep. 14, 2020
Applicant:

Protochips, Inc., Morrisville, NC (US);

Inventors:

Franklin Stampley Walden, II, Raleigh, NC (US);

John Damiano, Jr., Holly Springs, NC (US);

Daniel Stephen Gardiner, Wake Forest, NC (US);

David P. Nackashi, Raleigh, NC (US);

William Bradford Carpenter, Asheville, NC (US);

Assignee:

Protochips, Inc., Morrisville, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01); H01J 37/26 (2006.01); H01J 37/32 (2006.01); H01J 49/04 (2006.01); G01N 1/28 (2006.01); H01J 37/34 (2006.01); G02B 21/32 (2006.01); G02B 21/34 (2006.01); G01N 25/48 (2006.01); G01N 23/20033 (2018.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); G01N 1/28 (2013.01); G01N 23/20033 (2013.01); G01N 25/484 (2013.01); G02B 21/32 (2013.01); G02B 21/34 (2013.01); H01J 37/26 (2013.01); H01J 37/32724 (2013.01); H01J 37/3497 (2013.01); H01J 49/0468 (2013.01); H01J 49/0486 (2013.01); G01N 2035/00376 (2013.01); H01J 2237/2001 (2013.01); H01J 2237/2002 (2013.01); H01J 2237/2003 (2013.01);
Abstract

A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.


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