The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Aug. 25, 2022
Protochips, Inc., Morrisville, NC (US);
Franklin Stampley Walden, II, Raleigh, NC (US);
John Damiano, Jr., Holly Springs, NC (US);
David P. Nackashi, Raleigh, NC (US);
Daniel Stephen Gardiner, Wake Forest, NC (US);
Mark Uebel, Morrisville, NC (US);
Alan Philip Franks, Durham, NC (US);
Benjamin Jacobs, Apex, NC (US);
Protochips, Inc., Morrisville, NC (US);
Abstract
Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.