The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Jan. 26, 2022
Protochips, Inc., Morrisville, NC (US);
Franklin Stampley Walden, II, Raleigh, NC (US);
John Damiano, Jr., Holly Springs, NC (US);
David P. Nackashi, Raleigh, NC (US);
Daniel Stephen Gardiner, Wake Forest, NC (US);
Mark Uebel, Morrisville, NC (US);
Alan Philip Franks, Durham, NC (US);
Benjamin Jacobs, Apex, NC (US);
Joshua Brian Friend, Raleigh, NC (US);
Katherine Elizabeth Marusak, Cary, NC (US);
Nelson L Marthe, Jr., Cary, NC (US);
Benjamin Bradshaw Larson, Cary, NC (US);
Protochips, Inc., Morrisville, NC (US);
Abstract
Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.