Growing community of inventors

Raleigh, NC, United States of America

David P Nackashi

Average Co-Inventor Count = 4.46

ph-index = 9

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 235

David P NackashiJohn Damiano, Jr (45 patents)David P NackashiDaniel Stephen Gardiner (24 patents)David P NackashiFranklin Stampley Walden, Ii (23 patents)David P NackashiStephen E Mick (21 patents)David P NackashiMark Alan Uebel (13 patents)David P NackashiAlan Philip Franks (11 patents)David P NackashiWilliam Bradford Carpenter (10 patents)David P NackashiBenjamin Jacobs (8 patents)David P NackashiMichael Zapata, Iii (7 patents)David P NackashiJoshua Friend (6 patents)David P NackashiKatherine Elizabeth Marusak (6 patents)David P NackashiThomas G Schmelzer (5 patents)David P NackashiNelson L Marthe, Jr (3 patents)David P NackashiBenjamin Bradshaw Larson (3 patents)David P NackashiJames Rivenbark (2 patents)David P NackashiRebecca Thomas (2 patents)David P NackashiMontie Roland (2 patents)David P NackashiPaul Hakenewerth (2 patents)David P NackashiIi Franklin Stampley Walden (0 patent)David P NackashiJohn Damiano Jr (0 patent)David P NackashiFranklin Stampley Walden Ii (0 patent)David P NackashiJr John Damiano (0 patent)David P NackashiDavid P Nackashi (45 patents)John Damiano, JrJohn Damiano, Jr (55 patents)Daniel Stephen GardinerDaniel Stephen Gardiner (36 patents)Franklin Stampley Walden, IiFranklin Stampley Walden, Ii (30 patents)Stephen E MickStephen E Mick (23 patents)Mark Alan UebelMark Alan Uebel (30 patents)Alan Philip FranksAlan Philip Franks (11 patents)William Bradford CarpenterWilliam Bradford Carpenter (15 patents)Benjamin JacobsBenjamin Jacobs (8 patents)Michael Zapata, IiiMichael Zapata, Iii (7 patents)Joshua FriendJoshua Friend (7 patents)Katherine Elizabeth MarusakKatherine Elizabeth Marusak (6 patents)Thomas G SchmelzerThomas G Schmelzer (5 patents)Nelson L Marthe, JrNelson L Marthe, Jr (3 patents)Benjamin Bradshaw LarsonBenjamin Bradshaw Larson (3 patents)James RivenbarkJames Rivenbark (4 patents)Rebecca ThomasRebecca Thomas (2 patents)Montie RolandMontie Roland (2 patents)Paul HakenewerthPaul Hakenewerth (2 patents)Ii Franklin Stampley WaldenIi Franklin Stampley Walden (0 patent)John Damiano JrJohn Damiano Jr (0 patent)Franklin Stampley Walden IiFranklin Stampley Walden Ii (0 patent)Jr John DamianoJr John Damiano (0 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Protochips, Inc. (45 from 53 patents)


45 patents:

1. 12375815 - Automated application of drift correction to sample studied under electron microscope

2. 12284445 - Automated application of drift correction to sample studied under electron microscope

3. 12130858 - Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions

4. 12010430 - Automated application of drift correction to sample studied under electron microscope

5. 11902665 - Automated application of drift correction to sample studied under electron microscope

6. 11755639 - Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions

7. 11514586 - Automated application of drift correction to sample studied under electron microscope

8. 11477388 - Automated application of drift correction to sample studied under electron microscope

9. 11455333 - Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessions

10. 11399138 - Automated application of drift correction to sample studied under electron microscope

11. 11170968 - MEMS frame heating platform for electron imagable fluid reservoirs or larger conductive samples

12. 10986279 - Automated application of drift correction to sample studied under electron microscope

13. 10777380 - MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samples

14. RE48201 - Specimen holder used for mounting samples in electron microscopes

15. 10503127 - Method for safe control of gas delivery to an electron microscope sample holder

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