The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2024
Filed:
Sep. 11, 2023
Protochips, Inc., Morrisville, NC (US);
Franklin Stampley Walden, II, Raleigh, NC (US);
John Damiano, Jr., Holly Springs, NC (US);
David P. Nackashi, Raleigh, NC (US);
Daniel Stephen Gardiner, Wake Forest, NC (US);
Mark Uebel, Morrisville, NC (US);
Alan Philip Franks, Durham, NC (US);
Joshua Friend, Raleigh, NC (US);
Katherine Elizabeth Marusak, Cary, NC (US);
Protochips, Inc., Morrisville, NC (US);
Abstract
Disclosed herein are methods and systems of metadata management for reviewing data from microscopy experimental sessions. Image data from an experimental session is stored in an archive at one or more filepath locations, either locally or on a network. Metadata associated with the image data is stored in a database with a reference to the filepath where the raw image is stored, such that the metadata is associated in the database with the image data. A user can perform post-experimental filtering, sorting, and searching of the underlying image data using the metadata, which allows the image data to be analyzed without duplication of the image data and without manual review of each individual image. The filtered data is presented in an interactive timeline format.