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For the Inventor, By the Inventor

Los Altos, CA, United States of America

David Alles

This inventor holds 17 USPTO granted patents and 2 published patent applications and 3 EPO patents. Top assignees: Kla Tencor Corporation, Kla-Tencor Technologies Corporation, Bell Telephone Laboratories. Active years: 1979-2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: David Alles. Retrieved from https://idiyas.com/inventor/david-alles

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 17 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.4

ph-index = 9

Forward Citations = 403(Granted Patents)


Location History:

  • Covent Station, NJ (US) (1979)
  • Convent Station, NJ (US) (1979)
  • Los Altos, CA (US) (2003 - 2017)

Company Filing History:

goldMedal10 out of 1,787 
 
Kla Tencor Corporation
 patents
silverMedal5 out of 641 
 
Kla-Tencor Technologies Corporation
 patents
bronzeMedal2 out of 2,714 
 
Bell Telephone Laboratories
 patents

Years Active: 1979-2017

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17 patents (USPTO):Explore Patents
1. 9619878 - Inspecting high-resolution photolithography masks (2017-04-11),
2. 9348214 - Spectral purity filter and light monitor for an EUV reticle inspection system (2016-05-24),
3. 8928895 - Auto focus system for reticle inspection (2015-01-06),
4. 8772731 - Apparatus and method for synchronizing sample stage motion with a time delay integration charge-couple device in a semiconductor inspection tool (2014-07-08),
5. 7926959 - Beam conditioning to reduce spatial coherence (2011-04-19),
6. 7835015 - Auto focus system for reticle inspection (2010-11-16),
7. 7738093 - Methods for detecting and classifying defects on a reticle (2010-06-15),
8. 7379175 - Methods and systems for reticle inspection and defect review using aerial imaging (2008-05-27),
9. 7123356 - Methods and systems for inspecting reticles using aerial imaging and die-to-database detection (2006-10-17),
10. 7046352 - Surface inspection system and method using summed light analysis of an inspection surface (2006-05-16),
11. 7027143 - Methods and systems for inspecting reticles using aerial imaging at off-stepper wavelengths (2006-04-11),
12. 6748103 - Mechanisms for making and inspecting reticles (2004-06-08),
13. 6654489 - Apparatus and methods for collecting global data during a reticle inspection (2003-11-25),
14. 6529621 - Mechanisms for making and inspecting reticles (2003-03-04),
15. 6516085 - Apparatus and methods for collecting global data during a reticle inspection (2003-02-04),

Title: The Innovative Journey of David Alles

Introduction: David Alles, a talented inventor based in Los Altos, CA, has made significant contributions to the field of technology through his groundbreaking innovations and patents.

Latest Patents: David Alles holds several patents in the areas of artificial intelligence, renewable energy, and medical devices, showcasing his diverse range of expertise and creativity.

Career Highlights: With a background in engineering and a passion for problem-solving, David Alles has had a successful career working for leading tech companies in Silicon Valley before venturing into entrepreneurship to pursue his own projects.

Collaborations: Throughout his career, David Alles has collaborated with top researchers, engineers, and scientists to bring his ideas to life, fostering a culture of innovation and excellence in all his projects.

Conclusion: David Alles continues to push the boundaries of technology and innovation, leaving a lasting impact on the industry with his visionary ideas and inventive spirit.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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