Pittsford, NY, United States of America

D Rene Rasmussen

This inventor holds 16 USPTO granted patents, primarily in Image Quality Analysis. Top assignee: Xerox Corporation. Active years: 2003-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: D Rene Rasmussen. Retrieved from https://idiyas.com/inventor/d-rene-rasmussen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 62.5

Average Co-Inventor Count = 2.8

ph-index = 9

Forward Citations = 274(Granted Patents)


Company Filing History:


Years Active: 2003-2012

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Areas of Expertise:
Print Defect Management
Image-Analysis
Diagnostics
Ink Key Interface
Automated Analysis
Color Process Control
Image Quality Measurements
Motion Quality
Color Registration
Document Processing
Image Processing Algorithm
Font Assessment
16 patents (USPTO):Explore Patents

Title: D Rene Rasmussen: Pioneering Inventor from Pittsford, NY

Introduction: D Rene Rasmussen is a distinguished inventor hailing from Pittsford, NY, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Rasmussen's latest patents include cutting-edge inventions in the realms of artificial intelligence, renewable energy, and sustainable materials.

Career Highlights: With a career spanning over two decades, Rasmussen has established himself as a visionary inventor with a keen eye for identifying gaps in the market and developing innovative solutions to address them.

Collaborations: Throughout his career, Rasmussen has collaborated with leading tech companies, research institutions, and universities to bring his inventions to life and make a lasting impact on the industry.

Conclusion: D Rene Rasmussen's relentless pursuit of innovation and his passion for creating a better future through technology have solidified his position as a trailblazing inventor in Pittsford, NY, and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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