The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2010
Filed:
Jun. 28, 2004
D. Rene Rasmussen, Pittsford, NY (US);
Meera Sampath, Penfield, NY (US);
Edul N. Dalal, Webster, NY (US);
D. Rene Rasmussen, Pittsford, NY (US);
Meera Sampath, Penfield, NY (US);
Edul N. Dalal, Webster, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
The present invention is directed to a system and method for test target selection in conjunction with dynamic test pattern generation. In the invention, a test pattern page(s) is composed using an optimal set of test targets, which can be accommodated or adjusted to fit within size constraints of the test pattern. The method of the present invention makes use of layout optimization to ensure that related and optimized test targets are accommodated on a single test pattern. For example, it may be preferable to 'squeeze in' a smaller-than-normal uniform area target, rather than not to print it at all during a test.