The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2003
Filed:
Nov. 29, 1999
D. Rene Rasmussen, Pittsford, NY (US);
Edul N. Dalal, Webster, NY (US);
Xerox Corporation, Stamford, CT (US);
Abstract
An image quality analysis system is provided that can determine various aspects of image quality easily and with minimal user involvement and minimal user expertise. The system uses a scanner, either a stand-alone or part of a multi-function printer/scanner/copier, to scan a printed test pattern, and then perform a series of analyses on the scanned image using an image quality analysis module that may be built into the image output device being tested, or provided as a stand-alone component that can receive the output from the scanner. There are often a number of different test patterns that would be used depending on which print quality issues are being tested. By encoding each test pattern with a coded identification label, not only can the particular test pattern be identified, but the analysis to be performed can also be determined from the corresponding script when the printed test pattern is scanned and subsequently decoded. Particularly suitable decoders are OCR and barcode readers. Such identification labels and/or scripts can also be used to identify a particular machine that is being tested and other relevant information.